SCIE Paper List
Byungwhan Kim, Sang Hee Kwon, Kwang-Ho Kwon, Kyu-Ha Baek, Jin Ho Lee, Dong Hwan Kim, and Gary S. May, “Statistical Characterization of Process-Induced Plasma Damage”, Materials and Manufacturing Processes, 24: 610–614, 2009 (ISSN: 1042-6914)Moonkeun Kim, Beomseok Hwang, Yong-Hyun Ham, Jaehwa Jeong, Nam Ki Min, and Kwang-Ho Kwon, “Design, fabrication, and experimental demonstration of a piezoelec..
2014. 9. 2.
